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Symposium F
Nanoscale Electromechanical Phenomena in Advanced Materials for Energy and Biological Applications


  • Kaiyang ZENG, National University of Singapore, Singapore


  • Jiangyu LI, University of Washington, United States
  • Sergei KALININ, Oak Ridge National Laboratory, United States


  • Prof Kaiyang Zeng, National University of Singapore, Singapore
    Email: mpezk@nus.edu.sg
    Tel: +6565166627
    Fax: +6567791459
    Mailing Address:
    9 Engineering Drive 1
    Singapore 117576

Scope of Symposium

Electromechanical coupling is a fundamental phenomenon in many of the natural and functional materials and systems such as ferroelectrics, multiferroics, energy storage and biological systems. In ferroelectric materials, electromechanical behavior is directly linked to the polarization order parameter and hence can be used to study complex phenomena including polarization reversal, domain wall pinning, multiferroic interaction, and electron lattice coupling. This coupling effect is also a universal feature in virtually all biological systems, such as nerve-controlled muscle contraction on macroscale to cardiac activity and hearing on microscale. In addition, electromechanical coupling is a key component in virtually all electrochemical based energy storage systems, such as supercapacitors and rechargeable batteries. In this perspective, it forms a fundamental mechanism for many device applications, and thus is an emerging multidisciplinary topic for materials science, physics, chemistry and biology science (with the publications of more than 300/year).

The objective of this symposium is to bring together experts from materials science, biology, materials physics and chemistry communities, who are interested in electromechanical coupling processes; scanning probe microscopists for probing the nanoscale electromechanical coupling phenomena; and theorists interested in fundamental mechanisms of electromechanical coupling to discuss the newest research results, urgent needs, challenges, applications, and future trends for this rapidly emerging field.

The symposium will cover but not limited to following topics:

• Nanoscale electromechanical coupling in functional thin films and materials;
• Ferroelectric, piezoelectric and multiferroic thin films and devices;
• Local probing technique and in-situ measurement of energy storage materials such as supercapacitors, rechargeable batteries and so on;
• Application of biased Scanning Probe Microscopy techniques, such as Piezoresponse Force Microscopy; Kelvin Probe Force Microscopy; Electrostatic Force Microscopy; Electrochemical Strain Microscopy and/or Electrochemical Atomic Force Microscopy etc;
• Novel electromechanical phenomena at the nanoscale;
• Modeling and simulation of electromechanical phenomena at the nanoscale;
• Nanoscale electromechanical coupling of biological systems;
• Combination of the various SPM techniques (4D-SPM) for characterization of the nanoscale electromechanical phenomena, etc.


The manuscripts of all those papers that are presented at the conference and accepted after peer review will be published online in “Procedia Engineering” by  Elsevier. Details for online submission of the manuscripts will be made available by concerned symposium chair while accepting the paper for presentation at the conference.

Invited Speakers

  • Long-Qing CHEN, Department of Materials Science and Engineering, The Pennsylvania State University, United States ( Abstract )
  • Alexei GRUVERMAN, Department of Physics & Astronomy, University of Nebraska - Lincoln, United States ( Abstract )
  • Sergei KALININ, Oak Ridge National Laboratory, United States ( Abstract )
  • Andrei KHOLKIN, University of Aveiro, Portugal ( Abstract )
  • Kenji KITAMURA, Advanced Materials Laboratory, National Institute of Materials Science, Japan ( Abstract )
  • Alexander KORSUNSKY, Department of Engineering Science, Oxford University, United Kingdom ( Abstract )
  • Amit KUMAR, Department of Mechanical Engineering, National University of Singapore, Singapore ( Abstract )
  • Faxin LI, Department of Mechanics & Aerospace, Peking University, China ( Abstract )
  • Jun-Ming LIU, Department of Physics, Nanjing University, China ( Abstract )
  • Roger PROKSCH, Asylum Research Inc., United States ( Abstract )
  • A.K. SOH, Department of Mechanical Engineering, The University of Hong Kong, , China ( Abstract )
  • Jing ZHU, Department of Mechanical Engineering, National University of Singapore, Singapore ( Abstract )