KEY CONTACTS

ICMAT 2003 Secretariat
Materials Research
Society (Singapore)
c/o Institute of Materials
Research & Engineering
3 Research Link
Singapore 117602
Tel: (65) 6874 1975
Fax: (65) 6777 2393

 
 
 
NANOSCALE IMAGING AND CHARACTERISATION OF MATERIALS  
 
Chair:

Mark YEADON
Institute of Materials Research & Engineering
(IMRE)
3 Research Link, Singapore 117602
Tel: (65) 6874 8591
Fax: (65) 6872 0785
Email: m-yeadon@imre.a-star.edu.sg

Co-Chairs: H.GONG, Department of Materials Science, National University of Singapore (NUS)
M. PHILPOTT, Department of Materials Science, National University of Singapore (NUS)
S.WANG, IMRE
 

 
[ SCOPE OF THE SYMPOSIUM ]  
Exciting advances are being made in our understanding of the properties of materials at the nanometer length scale using a wide range of instrumentation techniques. This symposium will focus on materials imaging and analysis in the nanometer regime, covering the application of a range of techniques to the characterization of materials for advanced technologies.
 
   
[ TOPICS OF INTEREST ]  

• Electron energy loss spectroscopy
• High resolution electron imaging and Z-contrast techniques
• Novel instrumentation and techniques, including in-situ microscopies
• Scanned probe techniques
• Surface analytical techniquesProton Beam techniques
• Other techniques related to nanoscale imaging and characterisation

 
   
[ INVITED SPEAKERS ]  
C.B. BOOTHROYD
IMRE, Singapore
F.M. ROSS
IBM Yorktown, USA
N. BROWNING
University of Illinois, USA
S. PENNYCOOK
Oak Ridge National Laboratory, USA
L.J. CHEN
Tsinghua University, Taiwan
R. SILVA
University of Surrey, UK
R.S. GOLDMAN
University of Michigan, USA
A.T.S. WEE
National University of Singapore, Singapore
R.A. LUKASZEW
University of Toledo, Ohio
P. WHITFIELD
National Research Council, Canada
R.J. NEMANICH
North Carolina State University, USA
Y. ZHU
Brookhaven National Laboratory, USA
F. ROSEI
INRS-EMT University du Quebec, Canada
 
   
[ SCIENTIFIC COMMITTEE ]  
A. HUAN
NUS, Singapore
T. OSIPOWICZ
NUS, Singapore
E.S. TOK
NUS, Singapore
 
   
[ LOCAL ORGANISING COMMITTEE ]  
H. GONG
NUS
M. YEADON
IMRE
M. PHILPOTT
NUS
 
   
[ SPONSORS ]  

• JEOL (ASIA) Pte Ltd
• Leybold Vacuum
• EA Fischione
• Roper Industries Southeast Asia Company

 
   
[ JOURNAL ]  

Selected papers will be published in a special issue of International Journal of Nanoscience.
Invited paper maximum length 12 pages.
Contributed paper maximum length 6 pages.
Guidelines for manuscript preparation can be found here
The template for a Latex2e format can be downloaded at this site.